CAI, Y.; CLARENCE W. DE , C. W. D. S.; LI, B.; WANG, L.; WANG, Z. Application of Feature Extraction through Convolution Neural Networks and SVM Classifier for Robust Grading of Apples. Instrumentation, [S. l.], v. 6, n. 4, 2024. Disponível em: https://instrumentationjournal.com/index.php/instr/article/view/107. Acesso em: 23 feb. 2025.